1. High Accuracy theta-theta goniometer:  A theta-theta goniometer enables omega scans, 2-theta/omega scans, and 2- theta scans with the sample oriented horizontally. Additionally, the two axis are equipped with encoders to enable control of each axis at a resolution of 0.00010.

2. Attachment: XY attachment for automated XY mapping or an Rx Ry attachment for sample tilt alignment to be conducted before in-plane  o0r reciprocal spacemap (RSM) measurement. A newly developed connector allows easy changing of attachments.

3. X-ray generator: Even with a horizontal sample mount goniometer with a moving X-ray source, the product can incorporate a state of the art high-intensity 9kW rotating anode X-ray generator.

4. Cross Beam optics (CBO): The unit allows easy switching between the direct beam for para-focusing (Bragg-Brentano) optics for phase ID analysis and quantitative analysis of powder sample and a monochromatic parallel beam using a multilayer mirror for profile analysis of powder samples, measurement of preferred orientation, measurement of thin film samples, RSM measurement, and rocking curve measurement, simply by changing a selection slit.

5. Alignment mechanism (monochromators and analyzers):  You can select crystal index and type based on the resolution required for measurement. The 2-bounce monochromators, 4-bounce monochromators, and 2-bounce analyzers have built-in adjustment mechanism that enable automatic adjustment via control software.

6. Receiving analyzer system:

  • Double-slit analyzer with two variable slits on receiving side,para-focusing, small-angle scattering & reflectivity measurement geometries, etc.
  • Parallel-slit analyzer (PSA)
  • 2-bounce analyzer

7. Incident Optics system: The following mechanism enable switching between para-focusing optics, parallel beam optics, 2 or 4- bounce monochromator high resolution uptics, small-angle scattering optics and micro area measuremnents optics.

  • CBO unit
  • Standard incident beam
  • Standard incident slit box

8. Receiving optics system : the following mechanism enable selection of a board range of resolution characteristics for specific purposes.

  • Standard receiving slit box# 1
  • Standard receiving optics unit# 1
  • Standard receiving optics unit# 2
  • Standard receiving slit box# 2
  • Standard attenuator


9.Optics switching system:

10. Optical device detection:

  • Selection slit in CBO unit
  • Type of incident Soller slit or crystal monochromator
  • Width of incident slait
  • Length of length-limiting slit or type of collimator
  • Width of receiving slit
  • Type of analyser
  • Type of receiving Soller slit
  • Type of detector
  • Presence/absence of diffracted beam monochromator, etc

11. Control software : SmartLab Guidance used to control SmartLab also guides the user through required measurement procedures and condition-setting processes, in addition to providing conventional SmartLab control functions.

12.Two Slit SAXS optics: The two-slit SAXS optics incorporating a multilayer mirror can perform measurements with better accuracy and S/N ratios than conventional three-slit SAXS optics.

13.In-plane optics(208B212): The use of the in-plane arm and RxRy attachment enables measurements of in-plane diffraction by maintaining grazing incidence conditions during sample rotation.


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